Path: Home >> Test & Measurement
Product Center

Tektronix PA4000 offers stable, precise measurements

12 Apr 2013 | Steve Taranovich

The PA4000 Power Analyser from Tektronix features a Spiral Shunt design which provides power electronics engineers with stable and précises measurements even on highly distorted power waveforms.

See more



Test & Measurement
  • Design Center
  • Product Center
  • News Center
  • Webcasts
  • Blogs
Education & Training

• Advances in Conformal Coatings: Enhancing Reliability of Innovative TechnologiesNEW!
This webinar will focus on the Parylene's unique properties, how the coating is applied, examples of applications that benefit from Parylene's properties, and advances that have been made in adhesion technologies. As materials and applications continue to advance, Parylene coatings are increasingly being used to enhance the reliability of today's, and tomorrow's, innovative technologies.

• High Voltage Wafer Level Test - Tips, Tricks, and Pitfalls
In this seminar, we will identify, discuss, and propose solutions for a number of challenges related to high voltage...

• Understanding Electrical Characterization of Solar Cells
The target objective of the majority of research into photovoltaic devices is in the areas of improving the...

• Ethernet SFF-8431 SFP+ Compliance and Debug Testing Webinar
The Tektronix SFP+ PHY Testing Webinar will explore Tektronix Ethernet Solutions, SFP + PHY product testing challenges, as well as relevant Tektronix debugging solutions...

Design Center

Resistance measurement: Two-wire vs. four-wire 10/04/2013
Find out which configuration makes sense for your application.

Fix costly impairments with pre-deployment testing 25/03/2013
Know the best practices for data centre operators to ensure that the network equipment they use has been thoroughly tested.

Testing EPC to prepare for LTE/4G billing 22/03/2013
The best option for service providers to create accurate billing structures is to validate and optimise the performance as well as accuracy of the charging system components of the evolved packet core.

Stress testing for LTE devices 11/03/2013
Know the role of stress testing in improving the performance of LTE devices in the field.

Identify the right power supply for test apps 07/03/2013
Selecting the best power supply requires detailed investigation of its characteristics.

How to characterise mixed-signal IC for production 06/03/2013
Know the statistical techniques that ensure repeatability of test results, including testing over an ICs rated temperature extremes.

Understanding voice over LTE device testing 18/02/2013
As the LTE market reaches its first stage of maturity, many operators are launching the first wave of VoLTE services. This article covers Big Data Analytics and VoLTE device testing.

Powering automated test equipment 22/01/2013
Know the power distribution network design considerations for automated test equipment.

Grasping linear power supply's data sheet (Part 2) 11/01/2013
This instalment focuses on specifications related to a DC power supply's AC characteristics, as well as a variety of other performance considerations.

Grasping linear power supply's data sheet (Part 1) 09/01/2013
Selecting the most appropriate power supply for a specific application requires understanding what those specs convey or (sometimes) what they may be intended to de-emphasise.

See more

Design Ideas

Prototyping a smart micro-grid for a solar PV system 19/04/2013
This project by the Nanyang Technological University integrates a solar photovoltaic energy resource with the battery energy storage system and demand response management into the micro-grid, building and home.

Hack into stopwatch to create phototimer 11/04/2013
Two transistors create a pulse train to operate a stopwatch.

Estimate inductance with air-core coil resistance 08/04/2013
If the coil is tightly wound you do not need the number of turns to calculate inductance.

Auto pulse generator responds to probed load 04/03/2013
This handy pulse generator can be used to inject momentary power pulses into a circuit under test.

Simplify testing of twisted-pair cables 01/03/2013
Easily test a cable containing twisted-wire pairs and detect open or reversed pairs, shorted pairs and shorts between unrelated pairs.

Measuring resistance in micro-ohms range 17/01/2013
Here's a complete, low-cost, software-programmable ohmmeter designed to measure resistances in the micro-Ohm range.

Simple diode acts as sensor for thermal probe 04/01/2013
A two-transistor thermal probe can be employed to detect circuit problems such as hot components and thermal runaway.

IC manages room temperature 02/01/2013
Here's a simple temperature-controlled fan circuit that can be built with minimal external component count.

Digital voltmeter employs multi-channel ADC 30/11/2012
Discover how to monitor several different voltages with just one instrument.

Protect your UUT with power-supply decoupler 31/10/2012
Learn how to detect and shutdown reverse polarity or overvoltage before damage occurs.

See more

Product Center

Xsens rolls out dev kit for wireless orientation tracking 23/05/2013
The MTw development kit contains a highly accurate, small, lightweight and wireless IMU with full AHRS capabilities, providing drift free orientation.

Downloadable JTAG suite boasts speedy board failure test 23/05/2013
The JTAGLive Studio is a comprehensive package of Python-based JTAG boundary-scan tools that enable electronic designers and test engineers to develop complete PCB test and programming applications.

Aeroflex touts TEDS option for the 3920 radio test set 22/05/2013
The TETRA Enhanced Data Service option enables the technician or engineer to use the 3920 for verifying the operation of TEDS mobile stations and base stations.

Latest PC benchmarking tool enters final dev't stage 22/05/2013
PCMark 8 has been developed in partnership with development program members including Intel, Microsoft, NVIDIA and Samsung.

Kepco improves DC electronic loads to handle up to 800A 22/05/2013
Several enhancements to the EL series of single and dual channel DC electronic allow the devices to have increased current capability of up to 800 A at 5 kW.

Geotest-Marvin extends PXI chassis portfolio 21/05/2013
The GX7200 requires one slot for the controller, offering 20-slots for PXI-1, PXI-hybrid and PXIe modules while the GX7800 is an 8-slot, 3U PXI chassis that can support up to seven instruments.

System chassis eases dev't, testing, deployment 17/05/2013
The Emerson Network Power VPX KR8-VPX-3-6-1 system chassis accommodates up to five 3U VPX payload blades and associated rear transition modules.

Digital multi-meter adds software options for remote SCPI 17/05/2013
Rigol Technologies' DM3058E digital multi-meter sports a dual display and 240,000 count resolution as well as software options that enable data logging and remote SCPI programming from any interface.

Ground-bond tester ready to meet safety testing standards 16/05/2013
Associated Research's Model 3145 ground-bond tester is engineered to aid manufacturers meet international safety testing standards, including UL 2202, UL 1703, and IEC 61730-2.

Spectronics rolls out UV-A LED lamps ready for NDT apps 16/05/2013
The PowerMax 365 Series UV-A LED flood lamps feature a panel of 16 UV-A(365nm) LEDs made for non-destructive testing (NDT) applications and are available in four versions.

See more

News Center

Agilent service centre opens in Vietnam 04/01/2013
The Agilent Advantage Services facility in Hanoi, Vietnam will offer local calibration and repair services.

Mentor Graphics, HP deploy Questa CDC 19/12/2012
The solution for clock-domain crossing (CDC) verification targets designs from SoCs to FPGAs, allowing for consistent, company-wide methodologies.

B2900A power supplies boast low-noise sourcing 10/12/2012
Agilent technologies' one-channel B2961A and two-channel B2962A power supplies offer voltage and current sourcing with a noise floor of 10µV RMS.

Researchers develop sensor that mimics dog's nose 04/12/2012
Scientists at UC Santa Barbara have developed a chip capable of quickly identifying trace amounts of vapour molecules.

IEEE 1149.1-2012 JTAG standard passes ballot 09/11/2012
Intellitech said the standard incorporates industry best practices for enabling IC test re-use from silicon to systems and has reached consensus with an eighty-five per cent approval in a recent IEEE ballot.

NI discusses R&D focus, product strategy 02/11/2012
Conversation with Chandran Nair, managing director for Southeast Asia, and Victor Mieres, VP of Emerging Markets, reveals NI's R&D strategy and potential product differentiators.

Tektronix sets up calibration centre in Malaysia 24/09/2012
Servicing of Tektronix and Keithley instruments can now be done in the newly-opened Penang repair and calibration lab.

ScanWorks incorporates Teradyne's HSSub 12/09/2012
ASSET is integrating its platform into the PXI Express-based High Speed Subsystem that gives support for high-speed digital buses in new or legacy test systems aimed at defense/aerospace applications.

Agile methodologies facilitate automation 22/08/2012
Paying more attention to software quality pays long-term dividends.

Huawei reveals breakthrough on LTE to GSM ANR IOT 25/07/2012
Based on 3GPP R9 standards, Huawei's LTE to GSM ANR interoperability test cuts manual configuration for neighbor relations by 90 percent, improves handover success rates and decreases optimization costs.

See more

Webcasts
Blogs

News | Products | Design Features | Regional Roundup | Tech Impact