Advanced OFDM (Orthogonal Frequency Division Multiplex) technologies impose additional challenges and requirements for testing new wireless communication devices and systems. This paper compares and contrasts traditional single-carrier modulation schemes with multi-carrier OFDM schemes to understand the test equipment and measurement considerations when using modern vector signal generators and analyzers. It covers in detail spectrum, power, and modulation quality measurements and techniques for R&D and high-speed production test applications. The paper covers testing of both SISO (single-input, single-output) and MIMO (multiple-input, multiple-output) communications systems used in 802.11n WLAN, 802.16e mobile-WiMAX Wave 2, which are also applicable to future LTE and UMB cellular standards.
Participant Objectives:
This is the advanced seminar of a multi-part series on OFDM technologies and testing.
By attending this seminar you will learn:
| 1, |
Signal Generation and Analysis, Instrument Considerations. |
| 2. |
Spectrum measurement techniques and their application to high speed power measurements. |
| 3. |
OFDM Amplifier measurement considerations - Quantative Gain Compression. |
| 4. |
SISO OFDM measurement techniques. |
| 5. |
MIMO measurement considerations. |
| 6. |
MIMO measurement techniques. |
Sponsor:
Keithley Instrument Inc. http://www.keithley.com
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our products solve emerging measurement needs in production testing, process monitoring, product development, and research. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of precision measurement technology and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.
About the Presenter:
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Ron Rausch is Senior Marketing Manager for Keithley's RF Communications products. He has degrees in Electrical Engineering and Business Administration. Ron has over 30 years experience at HP, Agilent and Keithley Instruments working with RF and microwave test and measurement products in a wide variety of applications.
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