SEICA, SpA., a rovider of electronics testing and production solutions, and JTAG Technologies, a provider of boundary-scan products world-wide has announced the integration of their test methods within the Seica Pilot and Pilot LX flying probe in-circuit test systems. According to the companies, electronics designers and manufacturers will benefit from even greater testability and programmability of complex boards, all within a single process step.
Seica's flying probe systems are advanced fixtureless test systems with comprehensive shorts/opens, analog, power-up, vectorless, and AOI testing. The integrated boundary-scan capabilities-Powered by JTAG Technologies will now further enhance their digital testing capabilities, according to the companies. Test development and deployment times are minimized, test coverage is maximized, and fixturing is negligible, even for complex digital PCBs where physical access to electrical nodes is limited. The JTAG Technologies tools also provide high throughput in-system programming, via boundary-scan of on-board flash memories and PLDs.
Pilot and Pilot LX systems equipped with JTAG boundary-scan capabilities are available immediately via Seica's distribution channels with pricing for the boundary-scan option ranging from about $11K to $19K.
JTAG Technologies :
www.jtag.com.Seica S.p.A. :
www.seica.com.
