Keithley Launches Integrated Test Systems for Faster and Easier Semiconductor Testing
(Interviews, 15 May 2007 )
Keithley Instruments Inc. has announced the availability of ACS (Automated Characterization Suite) integrated test systems for semiconductor characterization at the device, wafer, and cassette level. With ACS integrated test systems, Keithley has created a variety of highly configurable and flexible test systems for semiconductor characterization that offer unique measurement capabilities with powerful automation-oriented software. ACS test systems provide faster measurements and greater system flexibility under one uniform software suite to fit unique test application needs.
Under the unified Automated Characterization Suite, Keithley's ACS integrated test systems incorporate a variety of test hardware and overall unique measurement capability:
- Keithley's powerful Model 4200-SCS Semiconductor Characterization System features I-V source-measure and specialized pulse testing packages, such as the Model 4200-PIV package for testing of advanced semiconductor materials.
- Series 2600 SourceMeter Instruments feature TSP-Link and Test Script Processor (TSP) for scalable I-V channel count systems, fast parallel measurements, and complex test sequences for applications such as on-the-fly NBTI or on-wafer component characterization.
- Series 2400 SourceMeter Instruments feature high voltage and high current sourcing, which are unique in applications such as high power MOSFETs and display drivers.
- Optional switching, C-meters, and pulse generators round out the instrument capabilities of ACS integrated test systems.
ACS integrated test systems are available in basic bench-top configurations or in factory-integrated full-height rack configurations.
