Rohde & Schwarz analysis software handles both standards-based and proprietary OFDM schemes
(Technology News, 30 Apr 2008 )
The new R&S FSQ-K96 application software from Rohde & Schwarz provides modulation measurement capability on OFDM signals. The OFDM demodulator software, which runs on the R&S FSQ signal analyzer, offers development engineers new degrees of freedom. It is the first solution to allow OFDM test setups to be configured with utmost flexibility for standards such as WiMAX or WLAN, while also addressing the analysis of proprietary OFDM-based modulation schemes. With a frequency range of 50 MHz to 40 GHz, the R&S FSQ covers even microwave applications.
The OFDM demodulator from Rohde & Schwarz addresses key measurement requirements in design and development: Relevant test parameters are user-configurable and users can select predefined configurations for common transmission methods. This provides development engineers with a highly flexible measurement solution that facilitates the analysis of proprietary OFDM signals. Proprietary schemes are used, for example, in the defense sector or when creating new standards. The OFDM demodulator is also ideal when assessing modulation quality or performing power, EVM, channel, or constellation measurements. It provides smooth and reliable measurements of transmit systems as well as fault diagnosis in the development of RF chipsets.
Comprehensive setting capabilities are another R&S FSQ-K96 advantage. They allow test parameters to be optimally configured for the signal to be analyzed. In addition to the frequency or level, the user can select general OFDM parameters such as carrier offset, number of carriers, sampling rate, or length of the guard interval. Other user-definable parameters include the preamble structure, the positions and values of pilot carriers, and the positions and modulation formats of data carriers.
R&S FSQ-K96 demodulates OFDM and OFDMA signals with any type of PSK or QAM modulation, and, due to its low residual EVM, the R&S FSQ performs EVM measurements with high accuracy. Intuitive user guidance, convenient evaluation functions, and the presentation of results in numeric tables (e.g. averaged EVM or I/Q offsets) and graphs speed up signal analysis. All measurements can be performed at the RF and, optionally, in the baseband.
