Geotest has joined the Semiconductor Test Consortium (STC), the semiconductor industry's leading proponent for the development and adoption of value-added open test standards. As a member, Geotest will be an active participant on the Portable Test Instrument Module (PTIM) Working Group, which is part of the Semiconductor Test Interface eXtensions (STIXT) initiative.
“Industry involvement is vital to the STC’s current success, and we are thrilled to have Geotest - Marvin Test Systems, Inc. join the STC," said Bob Helsel, STC Manager. "As a major player in the PXI market, Geotest’s STC membership and participation in the PTIM working group is a welcome addition and offers additional momentum to the overall effort and goals of STC to develop specifications and recommendations that leverages industry standard platforms and tools.”
Loofie Gutterman, Geotest’s president, expressed the importance of being a part of the organization responsibile for promoting standardized test solutions within the seminconductor test industry. “We are pleased to be working with the STC to develop value-added standards and recommendations for the semiconductor test industry," Gutterman said. "I believe these collaborative efforts will help end users create cost effective test solutions for both current and future semiconductor technologies and products. I'm confident that, as an industry leader, we can help the PTIM Working Group achieve their goal of adopting value-added open test guidelines and recommendations."
The PTIM Working Group was created to address the rapid integration of ancillary measurement capabilities, while providing a valid business model for both the instrument and equipment maker. The development of integration guidelines will enable rapid integration of the more than 1500 PXI and other instrument standards into ATE platforms.
Geotest, www.geotestinc.com
