Texas Instruments Inc. has developed an analog-to-digital-converter (ADC) that combines 12 bits of resolution with a 1GSps sampling rate, effectively doubling the amount of signal bandwidth that can be captured in a single ADC. The ADS5400 offers an unmatched signal-to-noise ratio (SNR) of 59dBFS and 75dBc spurious-free dynamic range (SFDR) in first Nyquist, and 58dBFS SNR and 70dBc SFDR performance for intermediate frequencies (IFs) beyond 1GHz. A fully buffered analog input isolates the onboard sample and hold’s internal switching to prevent disturbing the signal source, while providing a high-impedance input. The ADS5400’s performance enables designers to create smaller, higher-performance and higher-density wide-bandwidth receivers and digitizers.
“Customers can use the ADS5400's ground-breaking combination of resolution, sample rate and bandwidth to significantly enhance applications in defense by improving radar and signal intelligence (SIGINT) capabilities, and can double the capture bandwidth of signals with 12-bit resolution in test and measurement,” said Art George, Senior Vice President of TI's High-Performance Analog business unit.
Developed on TI’s high-speed, proprietary BiCom3 complementary bipolar SiGe technology, the monolithic ADS5400 is specified over the full industrial temperature range (-40°C to 85°C). The BiCom3 technology’s silicon-on-insulator (SOI) process makes it well suited for high-temperature and high-radiation environments.
Texas Instruments ADS5400 ADC
Texas Instruments
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