Free Print Subscription Printer-friendly version Email to a Friend

STMicroelectronics Joins CEA-Leti IMAGINE Program to Develop Multiple E-Beam Lithography

(Technology News, 19 Jan 2010 )

STMicroelectronics (ST) and French semiconductor research institute CEA-Leti have signed an agreement for STMicroelectronics to join the new industry/research multi-partner program IMAGINE, led by CEA-Leti, which includes TSMC, for mask-less lithography for IC manufacturing. This three-year program is meant to allow companies to assess a maskless lithography infrastructure for IC manufacturing and the use of MAPPER Technology for high-throughput. The multiple e-beam lithography program covers a global approach to the technology, including tool assessment, patterning and process integration, data handling, prototyping and cost analysis.

“STMicroelectronics has been working for more than a decade with CEA-Leti on maskless lithography. Together, ST and CEA-Leti have established a full shaped-beam capability on ST’s Crolles pilot line and demonstrated the insertion of e-beam technology in a standard CMOS process flow,” said Joël Hartmann Silicon-Technology Development Director for STMicroelectronics, at Crolles, France. “Joining the IMAGINE program is a logical step for ST to get access to a mask-less lithography possible solution for future technology nodes.”

“The IMAGINE program will benefit from the strong knowledge and support of STMicroelectronics in maskless technology,” said Leti’s CEO, Laurent Malier. “The experience of CEA-Leti in e-beam technology has been strengthened over the years by this partnership with ST for using e-beam for advanced technology demonstrators. With STMicroelectronics supporting the IMAGINE program, we are convinced we will succeed to make maskless lithography a viable solution.”

STMicroelectronics

CEA-Leti


RELATED ARTICLES
STMicroelectronics Unveils Details of New MEMS Accelerometer Family

STMicroelectronics Unveils Details of New MEMS Accelerometer Family

Enel Green Power, Sharp and STMicroelectronics Partner on PV-panel Manufacturing

STMicroelectronics Receives EuroDOCSIS 2.0 Certification for Set-top Box Reference Design

STMicroelectronics Reorganizes Regional Structure

 
Free Print Subscription Printer-friendly version Email to a Friend
Article Rating 
Average Rate: No rating yet
 
Poor Quite Good Good Very Good Excellent
 
 
Related Content 
 
 
ADVERTISEMENT
 
 
WEBCASTS
 
RESOURCE CENTER
 
Highest Rated  
 
 
 
 
 
ADVERTISEMENT
 
 
 
 
 
 


RSS
   
   
   
   
   
   
   
   
   
   
   
   
   
   
   
   
   
   
   
   
   

POLL
What type of environmental regulation do you think will be most beneficial for the tech industry?
Proper recycling and disposal
Push for power efficiency and energy conservation
Chemical/lead regulation
View results

 
 
 


 
 
Power Technology E-newsletter 
EMC-compliant DC/DC µModule Regulator Rated at 1A, 36V EDNA, November 09
Digital Power IC Market to Surge at 19.8% CAGR EDNA, September 09
Dual-input, Single-output Power Supply Selector Switch Reduces System Size while Improving Integrity EDNA, February 08
 
Analog E-newsletter 
Ambient-light Sensors Pack in Features to Help Applications Get Smarter, Greener
EDNA, November 09
 

 
KNOWLEDGE CENTER
 
Texas Instruments: DaVinci™ Technology
 
Texas Instruments: Safe Bet Series
 
 
INDUSTRY LINKS
 
Photonics Association (Singapore)
Singapore Industrial Automation Association (SIAA)
Taiwan Semiconductor Industry Association (TSIA)
 
 


 
 
OUR SPONSORS
 





Keithley Instruments
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our products solve emerging measurement needs in production testing, process monitoring, product development, and research...
 
 
     
 



Canon Communications Asia
EDN India | EDN Taiwan | EDN Korea | EDN Japan | EDN China | EDN | EDN Europe

 
ABOUT EDN Asia | FREE SUBSCRIPTION | CONTACT US
   
© 2010 Canon Communications
All rights reserved. Use of this web site is subject to its Terms and Conditions of Use. View our Privacy Policy.