Linking design and manufacturing
Product engineers play a crucial part in the development of a device. Maxim Integrated's product-engineering lab showcases tasks for which…
A day in Maxim’s product engineering lab
A day in Maxim Integrated's product engineering lab opens your eyes to the different tasks they perform to make sure…
USB-based spectrum analyser adds built-in bias tee
The TTR500 Series offers a full 2-port, 2-path S-parameter VNA for applications such as measuring passive/active components, antennas and matching…
R&S introduces flexible IoT test system for Cat 1
The R&S TS 290 test system is made up of an R&S CMW290 functional radio communication tester and the R&S…
LXI digitisers sample signals at up to 5Gsample/sec
Each channel of a DN6.22x series digitiser features its own ADC, acquisition memory (1GSample/channel) and independent signal conditioning circuitry.
Radio comms tester adds IEEE 802.11ac signalling
The R&S CMW500 wideband radio communication tester can be used to measure LTE-WLAN traffic offloading or analyse coexistence interference in…
DesignCon 2017: PAM4 catching on, but remains in flux
While PAM4 and forward error correction may have solved the bandwidth problem (for now), they've created a new set of…
Linear Technology’s damage evaluation on amplifier
A curve tracer shows the current vs voltage characteristic when overdriving specific pin combinations.
R&S VTx video tester supports HLG-capable devices
The R&S VTC/VTE/VTS tester family is based on the flexible T&M module for HDMI and HDR tests.
Understanding near-field probe scanning
Near-field measurements are easily misinterpreted and significant care is needed to ensure proper conclusions are drawn.