MEMS accelerometers deliver low noise density
Article By : EDN Asia
The ADXL1001 and ADXL1002 deliver vibration measurements for early detection of bearing faults and other common causes of machine failure.
Analog Devices has introduced two high frequency and low noise MEMS accelerometers targeting industrial condition monitoring applications.
The ADXL1001 and ADXL1002 MEMS accelerometers deliver vibration measurements needed for early detection of bearing faults and other common causes of machine failure, according to Analog Devices.
Historically, inadequate noise performance of available high frequency MEMS accelerometers compared with legacy technology held back adoption, failing to take advantage of MEMS reliability, quality and repeatability. Today, the ADXL1001 and ADXL1002 noise performance over high frequencies is on par with available PZT technology, the company said.
The ADXL1001 and ADXL1002 MEMS accelerometers deliver ultra-low noise density over an extended bandwidth with high-g range. The accelerometers are available in two models with full-scale ranges of ±100g (ADXL1001) and ±50g (ADXL1002). Typical noise density for the ADXL1002 is 25μg/√Hz, with a sensitivity of 40mV/g, and 30μg/√Hz for ADXL1001 with sensitivity 20mV/g.
Both accelerometers operate on single voltage supply from 3.0V to 5.25V and a complete, electrostatic self-test and over range indicator. The ADXL1001 and ADXL1002 are rated for operation over a -40°C to 125°C temperature range.