2021-08-30 - Keysight Technologies Inc.

H3C taps Keysight for PCIe compliance validation, 5G small cell performance testing

H3C has selected Keysight for PCIe compliance validation and 5G small cell performance testing to capture opportunities in data compute…

2021-08-18 - Jellenie Rodriguez and Mary McCarthy

Optimizing RTD temperature sensing systems: Challenges

With their accuracy and stability, RTDs play an important role in multiple end applications, but selecting and designing the best…

2021-08-09 - NI

NI and Seagate partner to improve how data accelerates AV technology

NI and Seagate Technology Holdings are collaborating to enhance data storage and transfer services.

2021-07-26 - Jessy Cavazos

Validating 5G device and network performance in a lab environment

Understanding 5G handset and network equipment performance prior to live deployment is vital to a timely and smooth 5G service…

2021-07-08 - Majeed Ahmad

Test solutions bolster security in IoT designs

A new application security test mathematically guarantees bug-free code in embedded designs.

2021-07-06 - Chroma ATE Inc.

Chroma power conversion systems for ESS testing

High-voltage conversion and high-power density trends are spurring the gradual increase in demand for bidirectional power supply test equipment.

2021-06-24 - Jessy Cavazos

Overcome 5G NR conformance testing challenges

Solutions that facilitate the interpretation of 3GPP specifications and simplify the test setup help overcome conformance testing challenges.

2021-06-22 - DeWitt C. Seward

Fuzz testing strengthens IoT device security

Fuzz testing can be used to effectively harden embedded networking stacks and thus strengthen IoT device security.

2021-06-22 - Robert Heider

Fixing a quantization error for a micro encapsulation product

The signal used to control the mass flow rate of a machine in a micro encapsulation process sets the output…

2021-06-17 - Arthur Pini

Acquisition memory in a digitizing instrument

Acquisition memory length is an important specification that can affect a digitizing instrument's sampling rate and bandwidth.